![]() ![]() 3–5,8 Due to the geometry of the DAC system, the samples are typically thin in the dimension along the X-ray beam and thus 2D imaging, as opposed to 3D, is often adequate. ![]() ![]() Obtaining information about the inhomogeneity of samples in a DAC involves manually collecting and analyzing the XRD data at multiple sets of chosen points, e.g., a 2-dimensional (2D) grid, across a sample volume of interest. In situ X-ray diffraction (XRD) at synchrotron beamlines has been widely used to characterize important materials properties, such as crystal structure, unit cell dimensions, polymorph fractionation, grain size, texture (preferred grain orientations), anisotropic strain, pressure gradient, etc. Two examples of iron and zirconium samples under high pressure are presented to demonstrate the applications of SXDM. The XDI is a standalone program and can be generally used for displaying SXDM images. ![]() The XDI program provides a graphical interface for constructing and displaying the SXDM images in several modes: (1) phase mapping based on structural information, (2) pressure visualization based on the equation of state, (3) microstructural features mapping based on peak shape parameters, and (4) grain size and preferred-orientation based on peak shape parameters. A new computer program, X-ray Diffractive Imaging (XDI), has been developed with the SXDM system. The recording of XRD is made during the continuous motion of the sample using a fast (millisecond) X-ray area detector in synchrony with the sample positioners, resulting in a highly efficient data collection for SXDM. In SXDM, the X-ray diffraction (XRD) is collected in a forward scattering geometry from points on a two-dimensional grid by fly-scanning the sample with respect to a micro-focused X-ray beam. The system utilizes scanning X-ray diffraction microscopy (SXDM) and is optimized for use with diamond anvil cell devices. We have designed and implemented a new experimental system for fast mapping of crystal structures and other structural features of materials under high pressure at the High Pressure Collaborative Access Team, Sector 16 of the Advanced Photon Source. ![]()
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